Plasma Enhanced CVD System PD-220NL
Compact loadlock system for R&D

Description

The PD-220NL is a load lock plasma-enhanced chemical vapor deposition (PECVD) system designed for silicon-based thin film deposition for research and development. It deposits SiO2 and SiNx films with uniform thickness and controlled stress. The system supports both stable 13.56 MHz processing and dual-frequency 13.56 MHz/400 kHz processing for film stress control. It also accommodates liquid precursor processes, such as TEOS and SN-2, as well as SiH4-based processes. The system processes multiple small wafers using a ø230 mm carrier tray and can handle different wafer sizes by changing the tray.

Key Features and Benefits

  • Processing up to ø220 mm (ø3" x 5, ø4" x 3, ø8" x 1)
  • Superior uniformity and stress control
  • Excellent process stability and repeatability
  • Robust system with minimal running / maintenance cost
  • User-friendly touch screen interface for parameter control and recipe storage.
  • With its sleek, compact design, the PD-220NL requires minimal cleanroom space
  • Dual-frequency (13.56 MHz + 400 kHz) PECVD for superior process control

Applications

  • SiH4-SiNx
  • SiH4-SiO2
  • Liquid precursor (SN-2) SiNx
  • TEOS-SiO2